Thermoelastic analysis of GaAs in LEC growth configuration. II: Temporal evolution of the stress field
- Author
- MOTAKEF, S1
[1] MIT, dep. mechanical eng., Cambridge MA 02139, United States - Source
Journal of crystal growth. 1988, Vol 88, Num 3, pp 341-352 ; ref : 16 ref
- CODEN
- JCRGAE
- ISSN
- 0022-0248
- Scientific domain
- Crystallography; Geology; Metallurgy, welding
- Publisher
- Elsevier, Amsterdam
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Keyword (fr)
- Analyse thermomécanique Champ contrainte Champ température Composé minéral Croissance cristalline Encapsulation liquide Gallium Arséniure Interface croissance Interface liquide solide Méthode Czochralski
- Keyword (en)
- Thermomechanical analysis Stress distribution Temperature distribution Inorganic compound Crystal growth Liquid encapsulation Gallium Arsenides Growth interface Liquid solid interface Czochralski method
- Keyword (es)
- Análisis termomecánico Campo restricción Campo temperatura Compuesto inorgánico Crecimiento cristalino Encapsulación líquida Galio Interfase crecimiento Interfase líquido sólido Método Czochralski
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A10 Methods of crystal growth; physics of crystal growth / 001B80A10A Theory and models of crystal growth; physics of crystal growth, crystal morphology and orientation
- Discipline
- Physics and materials science
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 6990598
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/0022-0248(88)90006-1 
https://dx.doi.org/10.1016/0022-0248(88)90006-1
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