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Tracking tunneling microscopy

Author
POHL, D. W1 ; MÖLLER, R
[1] IBM, res. div., Rüschlikon 8803, Switzerland
Source

Review of scientific instruments. 1988, Vol 59, Num 6, pp 840-842 ; ref : 12 ref

CODEN
RSINAK
ISSN
0034-6748
Scientific domain
Electronics; Physics
Publisher
American Institute of Physics, Woodbury, NY
Publication country
United States
Document type
Article
Language
English
Keyword (fr)
Microscopie tunnel balayage Mode Poursuite Mode poursuite
Keyword (en)
Scanning tunneling microscopy Mode of operation Tracking mode Tracking(movable target)
Keyword (es)
Microscopía túnel barrido Modo Persecución y continuación
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G78 Electron, positron and ion microscopes, electron diffractometers and related techniques

Discipline
Metrology
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
6996984

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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