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Photorefractive imaging of semiconductor wafers

Author
BYLSMA, R. B1 ; OLSON, D. H; GLASS, A. M
[1] AT&T Bell Laboratories, Holmdel NJ 07733, United States
Source

Applied physics letters. 1988, Vol 52, Num 13, pp 1083-1085 ; ref : 9 ref

CODEN
APPLAB
ISSN
0003-6951
Scientific domain
Crystallography; Electronics; Optics; Condensed state physics
Publisher
American Institute of Physics, Melville, NY
Publication country
United States
Document type
Article
Language
English
Keyword (fr)
Absorption optique Composé minéral Conductivité électrique Diffraction optique Diffusion porteur charge Effet photoréfractif Encapsulation liquide Etude expérimentale Fer Gallium Arséniure Impureté Indice réfraction Indium Phosphure Méthode Czochralski Méthode étude Niveau profond Photoconductivité Semiconducteur Temps relaxation Semiisolant
Keyword (en)
Optical absorption Inorganic compound Electrical conductivity Optical diffraction Charge carrier scattering Photorefractive effect Liquid encapsulation Experimental study Iron Gallium Arsenides Impurity Refraction index Indium Phosphides Czochralski method Investigation method Deep level Photoconductivity Semiconductor materials Relaxation time
Keyword (es)
Absorción óptica Compuesto inorgánico Conductividad eléctrica Difracción óptica Difusión portador carga Efecto fotorefractivo Encapsulación líquida Estudio experimental Hierro Galio Impureza Indice refracción Indio Método Czochralski Método estudio Nivel profundo Fotoconductividad Semiconductor(material) Tiempo relajación
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70B Electronic transport in condensed matter / 001B70B20 Conductivity phenomena in semiconductors and insulators / 001B70B20J Charge carriers: generation, recombination, lifetime, and trapping

Discipline
Physics of condensed state : electronic structure, electrical, magnetic and optical properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
7067032

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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