Tungsten-beryllium multilayer mirrors for soft x rays
- Author
- UTSUMI, Y1 ; KYURAGI, H; URISU, T; MAEZAWA, H
[1] NTT LSI Laboratories, Atsugi-shi Kanagawa 243-01, Japan - Source
Applied optics. 1988, Vol 27, Num 18, pp 3933-3936 ; ref : 23 ref
- CODEN
- APOPAI
- ISSN
- 0003-6935
- Scientific domain
- Electronics; Optics; Telecommunications
- Publisher
- Optical Society of America, Washington, DC
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Béryllium Coefficient réflexion Longueur onde Miroir Rayon X mou Rugosité Structure stratifiée Tungstène
- Keyword (en)
- Beryllium Reflectance Wavelength Mirror Soft X ray Roughness Laminated structure Tungsten
- Keyword (es)
- Berilio Coeficiente reflexión Longitud onda Espejo Rayo X blando Rugosidad Estructura estratificada Wolframio
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G85 X- and γ-ray instruments and techniques
- Discipline
- Metrology
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 7174662
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1364/AO.27.003933 
https://dx.doi.org/10.1364/AO.27.003933
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