Topical conference on silicon-based heterostructures II
- Author
- HOUGHTON, DEREK C (Editor)
American Vacuum Society, New York NY, United States (Funder/Sponsor)
National Research Council, Ottawa ON, Canada (Funder/Sponsor)
National res. council, inst. microstructural sci., Ottawa ON K1A 0R6, Canada - Conference name
- Topical conference on silicon-based heterostructures II (Chicago IL 1992-11-09)
- Source
Journal of vacuum science & technology. B. Microelectronics and nanometer structures. Processing, measurement and phenomena. 1993, Vol 11, Num 3, pp 1055-1198 ; ref : dissem
- ISSN
- 1071-1023
- Scientific domain
- Electronics
- Publisher
- American Institute of Physics, Melville, NY
- Publication country
- United States
- Document type
- Conference Proceedings
- Language
- English
- Keyword (fr)
- CVD Congrès Croissance cristalline Dispositif semiconducteur Epitaxie jet moléculaire Germanium alliage Hétérostructure Matériau semiconducteur Photoluminescence Propriété électrique Silicium alliage Silicium Structure électronique 9-10 Novembre 1992,Chicago Illinois
- Keyword (en)
- CVD Congress Crystal growth Semiconductor devices Molecular beam epitaxy Germanium alloys Heterostructures Semiconductor materials Photoluminescence Electrical properties Silicon alloys Silicon Electronic structure Illinois
- Keyword (es)
- Congreso
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H65 Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70C Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures / 001B70C61 Electrical properties of specific thin films
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A15 Methods of deposition of films and coatings; film growth and epitaxy / 001B80A15H Molecular, atomic, ion, and chemical beam epitaxy
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
- Pacs
- 6865 Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties
- Pacs
- 7361 Electrical properties of specific thin films and layer structures (multilayers, superlattices, quantum wells, wires, and dots)
- Discipline
- Electronics Physics and materials science Physics of condensed state : electronic structure, electrical, magnetic and optical properties Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 743153
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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