Workshop on expert evaluation and control of compound semiconductor materials and technologies
- Author
- KRAWCZYK, S. K (Editor)
CNRS, URA 848, lab. électronique, 69131 Ecully, France - Conference name
- Workshop on expert evaluation and control of compound semiconductor materials and technologies (1 ; Ecully 1992-05-19)
- Source
Materials science & engineering. B, Solid-state materials for advanced technology. 1993, Vol 20, Num 1-2
- ISSN
- 0921-5107
- Scientific domain
- Chemical industry parachemical industry; Metallurgy, welding; Condensed state physics
- Publisher
- Elsevier, Amsterdam
- Publication country
- Netherlands
- Document type
- Conference Proceedings
- Keyword (fr)
- Amélioration procédé Analyse performance Composant électronique Congrès Contrôle Couche mince Couche épitaxique Dispositif optoélectronique Epitaxie Etude expérimentale Etude théorique Evaluation performance Evaluation Microélectronique Optoélectronique Propriété physique Semiconducteur Structure électronique Technologie Transistor
- Keyword (en)
- Process improvement Performance analysis Electronic component Congress Check Thin film Epitaxial film Optoelectronic device Epitaxy Experimental study Theoretical study Performance evaluation Evaluation Microelectronics Optoelectronics Physical properties Semiconductor materials Electronic structure Technology Transistor
- Keyword (es)
- Mejoramiento procedimiento Análisis eficacia Componente electrónico Congreso Control Capa fina Capa epitáxica Dispositivo optoelectrónico Epitaxia Estudio experimental Estudio teórico Evaluación prestación Evaluación Microelectrónica Optoelectrónica Propiedad física Semiconductor(material) Estructura electrónica Tecnología Transistor
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 749214
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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