Reliability physics 1987, 25th annual proceedings, San Diego CA, April 7-9 1987
- Author
- IEEE. Electron Devices Society, New York NY, United States (Funder/Sponsor)
IEEE. Reliability Society, New York NY, United States (Funder/Sponsor) - Conference name
- International reliability physics symposium. 25 (San Diego 1987-04-07)
- Source
Reliability physics 1987, 25th annual proceedings, San Diego CA, April 7-9 1987. 1987, VIII-279 p
- Publisher
- IEEE, New York NY
- Publication country
- United States
- Document type
- Conference Proceedings
- Language
- English
- Keyword (fr)
- Circuit VLSI Circuit intégré Circuit ouvert Congrès Connexion électrique Contrainte mécanique Contrôle fabrication Corrosion Couche mince Diélectrique Défaillance Détection erreur Fabrication microélectronique Faisceau ionique Faisceau électronique Fiabilité Focalisation Humidité Interconnexion Microstructure Métallisation Passivation Rupture Stroboscopie Vérification Boîtier Champ température Choc thermique Contact électrique Cycle thermique Densité courant Disruption électrique Dissipation thermique Décharge électrique Dégradation Electrodiffusion Encapsulation Erreur accidentelle Fatigue thermique Gallium ? Arséniure Lithographie Microscopie Mémoire accès direct Mémoire morte Porteur charge Porteur chaud Recombinaison radiative Répartition spatiale Silicium Simulation Technologie MOS complémentaire Topographie Transistor effet champ Usure
- Keyword (en)
- VLSI circuit Integrated circuit Open circuit Congress Electrical connection Mechanical stress Processing control Corrosion Thin film Dielectric materials Failures Error detection Microelectronic fabrication Ion beam Electron beam Reliability Focusing Humidity Interconnection Microstructure Metallizing Passivation Fracture(mechanics) Stroboscopy Verification
- Keyword (es)
- Circuito VLSI Circuito integrado Circuito abierto Congreso Conexión eléctrica Tensión mecánica Control fabricación Corrosión Capa fina Dieléctrico Fallo Detección error Fabricación microeléctrica Haz iónico Haz electrónico Fiabilidad Focalización Humedad Interconección Microestructura Metalización Pasivación Ruptura Estroboscopía Verificación
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 7494409
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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Europe PubMed Central access
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