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Nonlocal electrical properties in mesoscopic devices

Author
UMBACH, C. P1 ; SANTHANAM, P; VAN HAESENDONCK, C; WEBB, R. A
[1] IBM, Thomas J. Watson res. cent., Yorktown Heights NY 10598, United States
Source

Applied physics letters. 1987, Vol 50, Num 18, pp 1289-1291 ; ref : 14 ref

CODEN
APPLAB
ISSN
0003-6951
Scientific domain
Crystallography; Electronics; Optics; Condensed state physics
Publisher
American Institute of Physics, Melville, NY
Publication country
United States
Document type
Article
Language
English
Keyword (fr)
Autocorrélation Circuit VLSI Circuit intégré Effet Aharonov Bohm Effet dimensionnel quantique Fluctuation Interférence Ligne transmission Longueur cohérence Magnétoconductivité Microscopie électronique transmission Oscillation périodique Phase Réduction échelle Tension électrique Transformation Fourier
Keyword (en)
Autocorrelation VLSI circuit Integrated circuit Aharonov Bohm effect Quantum size effect Fluctuations Interference Transmission line Coherence length Magnetoconductivity Transmission electron microscopy Periodic oscillation Phase Scale reduction Voltage Fourier transformation
Keyword (es)
Autocorrelación Circuito VLSI Circuito integrado Efecto Aharonov Bohm Efecto dimensional cuántico Fluctuación Interferencia Línea transmisión Longitud coherencia Magnetoconductividad Microscopía electrónica transmisión Oscilación periódica Fase Reducción escala Voltaje Transformación Fourier
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
7504904

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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