International conference on spectroscopic ellipsometry
- Author
- BOCCARA, A. C (Editor)
; PICKERING, C (Editor)
; RIVORY, J (Editor)
1
[1] CNRS Univ. Pierre Marie Curie, URA 781, lab. optique solides, 75252 Paris, France - Conference name
- International conference on spectroscopic ellipsometry (1 ; Paris 1993-01-11)
- Source
Thin solid films. 1993, Vol 233, Num 1-2
- CODEN
- THSFAP
- ISSN
- 0040-6090
- Scientific domain
- Crystallography; Electronics; Metallurgy, welding; Condensed state physics
- Publisher
- Elsevier Science, Lausanne
- Publication country
- Switzerland
- Document type
- Conference Proceedings
- Keyword (fr)
- Couche mince Croissance cristalline Electrochimie Ellipsométrie Germination cristalline Microélectronique Propriété optique Rugosité Semiconducteur Surface
- Keyword (en)
- Thin films Crystal growth Electrochemistry Ellipsometry Crystal nucleation Microelectronics Optical properties Roughness Semiconductor materials Surfaces
- Keyword (es)
- Germinación cristalina Semiconductor(material)
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70H Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation / 001B70H66 Optical properties of specific thin films
- Discipline
- Physics of condensed state : electronic structure, electrical, magnetic and optical properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 761741
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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