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Proceedings/9th Symposium on applied surface analysis, Dayton OH, June 3-5, 1987

Author
GRANT, J. T
Japan Electron Optics Laboratory, United States (Funder/Sponsor)
Microscience, United States (Funder/Sponsor)
Perkin-Elmer/Physical Electronics, United States (Funder/Sponsor)
Surface Science Laboratories, United States (Funder/Sponsor)
Conference name
Symposium on applied surface analysis. 9 (Dayton 1987-06-03)
Source

Surface and interface analysis. 1988, Vol 11, Num 6-7, 124 p. ; ref : dissem

CODEN
SIANDQ
ISSN
0142-2421
Scientific domain
General chemistry, physical chemistry; Nanotechnologies, nanostructures, nanoobjects; Condensed state physics
Publisher
Wiley, Chichester
Publication country
United Kingdom
Document type
Conference Proceedings
Language
English
Keyword (fr)
Analyse chimique Analyse surface Congrès Effet surface Microanalyse Photoexcitation RX Spectrométrie Auger Spectrométrie RX Spectrométrie photoélectron Dayton,1987
Keyword (en)
Chemical analysis Surface analysis Congress Surface effect Microanalysis X ray photoexcitation Auger electron spectrometry X ray spectrometry Photoelectron spectrometry
Keyword (es)
Análisis químico Análisis superficie Congreso Efecto superficie Microanálisis Fotoexcitación RX Espectrometría Auger Espectrometría RX Espectrometría fotoelectrón
Classification
Pascal
001 Exact sciences and technology / 001C Chemistry / 001C04 Analytical chemistry / 001C04C Spectrometric and optical methods

Discipline
Analytical chemistry
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
7674052

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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