Polarization active imaging
- Author
- CLEMENCEAU, P1 2 ; DOGARIU, A2 ; STRYEWSKI, J3
[1] Thomson-CSF Optronique, rue Guynemer BP 55, 78283 Guyancourt, France
[2] School of Optics/CREOL, University of Central Florida, Orlando, United States
[3] Computer Sciences Corporation, ISTEF, Kennedy Space Center, United States - Conference title
- Laser radar technology and applications V (Orlando FL, 26-28 April 2000)
- Conference name
- Laser radar technology and applications. Conference (5 ; Orlando FL 2000-04-26)
- Author (monograph)
- Kamerman, Gary W (Editor); Singh, Upendra N (Editor); Werner, Christian (Editor); Molebny, Vasyl V (Editor)
International Society for Optical Engineering, Bellingham WA, United States (Organiser of meeting) - Source
SPIE proceedings series. 2000, pp 401-409 ; ref : 14 ref
- ISBN
- 0-8194-3661-5
- Scientific domain
- Electronics; Optics; Physics; Telecommunications
- Publisher
- SPIE, Bellingham WA
- Publication country
- International
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Champ électromagnétique Discrimination Etude expérimentale Formation image Laser YAG Matrice Mueller Polarimétrie Polarisation Propagation longue distance Système actif
- Keyword (en)
- Electromagnetic fields Discrimination Experimental study Image forming YAG laser Mueller matrix Polarimetry Polarization Long distance propagation Active system
- Keyword (es)
- Discriminación Laser YAG Matriz Mueller Propagación larga distancia Sistema activo
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G60 Optical instruments, equipment and techniques / 001B00G60F Polarimeters and ellipsometers
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B30 Imaging and optical processing / 001B40B30V Image forming and processing
- Discipline
- Metrology Physics : optics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 781263
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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