Unified presentation of the 1/f noise in electronic devices: fundamental 1/f noise sources
- Author
- VAN DER ZIEL, A1
[1] Univ. Florida, dep. electrical eng., Gainesville FL 32611, United States - Source
Proceedings of the IEEE. 1988, Vol 76, Num 3, pp 233-258 ; ref : 97 ref
- CODEN
- IEEPAD
- ISSN
- 0018-9219
- Scientific domain
- Electronics; Computer science; Telecommunications
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Analyse spectrale Appareillage électronique Bruit basse fréquence Collision particule Diode barrière Schottky Fonction transfert Jonction p n Ligne transmission Transistor effet champ
- Keyword (en)
- Spectral analysis Electronic equipment 1/f noise Particle collision Schottky barrier diode Transfer function P n junction Transmission line Field effect transistor
- Keyword (es)
- Análisis espectral Equipo electrónico Ruido baja frecuencia Colisión partícula Diodo barrera Schottky Función traspaso Unión p n Línea transmisión Transistor efecto campo
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03D Electronic equipment and fabrication. Passive components, printed wiring boards, connectics
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 7838088
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/5.4401 
https://dx.doi.org/10.1109/5.4401
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