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Novel electronic properties of a potassium overlayer on Si(001)-(2×1)

Other title
Nouvelles propriétés électroniques d'un revêtement de potassium sur Si(001)-(2×1) (fr)
Author
CIRACI, S1 ; BATRA, I. P
[1] IBM, res. lab., San Jose CA 95193, United States
Source

Physical review letters. 1986, Vol 56, Num 8, pp 877-880 ; ref : 13 ref

CODEN
PRLTAO
ISSN
0031-9007
Scientific domain
Optics; Atomic molecular physics; Condensed state physics; Physics; Plasma physics
Publisher
American Physical Society, Ridge, NY
Publication country
United States
Document type
Article
Language
English
Keyword (fr)
Adsorption Calcul Densité charge Energie Silicium Structure bande Transition métal isolant Métal pur K
Keyword (en)
Adsorption Calculation Charge density Energy Silicon Band structure Metal insulator transition
Keyword (es)
Adsorcion Calculo Densidad carga Energia Silicio Estructura banda Transición metal aislante
Keyword (de)
Adsorption Berechnung Ladungsdichte Energie Silicium Bandstruktur
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70A Electron states / 001B70A15 Methods of electronic structure calculations

Pascal
001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A05 Specific materials / 001B80A05B Metals, semimetals and alloys

Discipline
Physics and materials science Physics of condensed state : electronic structure, electrical, magnetic and optical properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
7863227

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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