Pulsed laser atom probe analysis of semiconductor materials
- Autor
- CEREZO, A; GROVENOR, C. R. M; SMITH, G. D. W
- Fuente
Journal of microscopy (Print). 1986, Vol 141, Num 2, pp 155-170 ; ref : 1 p
- CODEN
- JMICAR
- ISSN
- 0022-2720
- Campo Científico
- Cell biology, histology; Optics
- Editor
- Blackwell Science, Oxford
- País de la publicación
- United Kingdom
- Tipo de documento
- Article
- Idioma
- English
- Palabra clave (fr)
- Composition chimique Couche mince Etude expérimentale Faisceau laser Faisceau pulsé Interface solide solide Semiconducteur Sonde atomique
- Palabra clave (in)
- Chemical composition Thin film Experimental study Laser beam Pulsed beam Solid solid interface Semiconductor materials Atom probe
- Palabra clave (es)
- Composicion quimica Capa delgada Estudio experimental Haz láser Haz pulsado Interfase sólido sólido Semiconductor(material) Sonda atómica
- Clasificación
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H90 Other topics in structure, and nonelectronic properties of surfaces and interfaces; thin films and whiskers
- Disciplina
- Physics of condensed state : structure, mechanical and thermal properties
- Procedencia
- Inist-CNRS
- Base de datos
- PASCAL
- Identificador INIST
- 7880177
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1111/j.1365-2818.1986.tb02712.x 
https://dx.doi.org/10.1111/j.1365-2818.1986.tb02712.x
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