Phénomènes de surface reliés à la structure électronique et aux défauts des matériaux technologiques
- Other title
- Surface phenomena related to the electronic structure and to the defects of technological materials (en)
- Author
- LE GRESSUS, C1 ; BOIZIAU, C
[1] CEN Saclay, IRDI/DESICP/DPC, Gif-sur-Yvette 91191, France - Conference name
- Colloque de métallurgie de Saclay. 28 (1985-06-17)
- Source
Annales de chimie (Paris. 1914). 1986, Vol 11, Num 3, pp 179-194 ; ref : 23 ref
- CODEN
- ANCPAC
- ISSN
- 0151-9107
- Scientific domain
- Chemistry; Metallurgy, welding
- Publisher
- Lavoisier, Cachan
- Publication country
- France
- Document type
- Conference Paper
- Language
- French
- Keyword (fr)
- Adsorption Bande conduction Diffusion Energie superficielle Fragilisation Frottement Interface liquide solide Interface solide solide Liaison chimique Mouillabilité Métal transition Polymère Propriété surface Structure électronique Usure Métal pur Ni
- Keyword (en)
- Adsorption Conduction band Diffusion Surface energy Embrittlement Friction Liquid solid interface Solid solid interface Chemical bond Wettability Transition metal Polymer Surface properties Electronic structure Wear
- Keyword (es)
- Adsorcion Banda conducción Difusion Energía superficial Fragilización Friccion Interfase líquido sólido Interfase sólido sólido Enlace químico Remojabilidad Metal transición Polimero Propiedad de superficie Estructura electronica Usura
- Keyword (de)
- Adsorption Leitungsband Diffusion Oberflaechenenergie Versproedung Reibung Grenzschicht fluessig fest Grenzschicht fest fest Chemische Bindung Benetzbarkeit Uebergangsmetalle Polymer Oberflaecheneigenschaft Elektronenstruktur Verschleiss
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H90 Other topics in structure, and nonelectronic properties of surfaces and interfaces; thin films and whiskers
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A05 Specific materials / 001B80A05B Metals, semimetals and alloys
- Discipline
- Metals. Metallurgy Physics and materials science Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 7969224
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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"O:13:\"PanistOpenUrl\":36:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000idc\";N;s:6:\"\u0000*\u0000fmt\";s:10:\"proceeding\";s:6:\"\u0000*\u0000doi\";s:0:\"\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:107:\"Ph\u00e9nom\u00e8nes de surface reli\u00e9s \u00e0 la structure \u00e9lectronique et aux d\u00e9fauts des mat\u00e9riaux technologiques\";s:9:\"\u0000*\u0000jtitle\";s:31:\"Annales de chimie (Paris. 1914)\";s:9:\"\u0000*\u0000stitle\";s:24:\"Ann. chim. (Paris, 1914)\";s:7:\"\u0000*\u0000date\";s:4:\"1986\";s:9:\"\u0000*\u0000volume\";s:2:\"11\";s:8:\"\u0000*\u0000issue\";s:1:\"3\";s:8:\"\u0000*\u0000spage\";s:3:\"179\";s:8:\"\u0000*\u0000epage\";s:3:\"194\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"0151-9107\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:10:\"LE GRESSUS\";s:10:\"\u0000*\u0000aufirst\";s:1:\"C\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:1:{i:0;s:10:\"BOIZIAU, C\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:6:\"ANCPAC\";s:8:\"\u0000*\u0000genre\";s:10:\"proceeding\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:107:\"Ph\u00e9nom\u00e8nes de surface reli\u00e9s \u00e0 la structure \u00e9lectronique et aux d\u00e9fauts des mat\u00e9riaux technologiques\";s:8:\"\u0000*\u0000place\";s:6:\"Cachan\";s:6:\"\u0000*\u0000pub\";s:9:\"Lavoisier\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Panist access
"O:12:\"IstexOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:10:\"proceeding\";s:6:\"\u0000*\u0000doi\";s:0:\"\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:107:\"Ph\u00e9nom\u00e8nes de surface reli\u00e9s \u00e0 la structure \u00e9lectronique et aux d\u00e9fauts des mat\u00e9riaux technologiques\";s:9:\"\u0000*\u0000jtitle\";s:31:\"Annales de chimie (Paris. 1914)\";s:9:\"\u0000*\u0000stitle\";s:24:\"Ann. chim. (Paris, 1914)\";s:7:\"\u0000*\u0000date\";s:4:\"1986\";s:9:\"\u0000*\u0000volume\";s:2:\"11\";s:8:\"\u0000*\u0000issue\";s:1:\"3\";s:8:\"\u0000*\u0000spage\";s:3:\"179\";s:8:\"\u0000*\u0000epage\";s:3:\"194\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"0151-9107\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:10:\"LE GRESSUS\";s:10:\"\u0000*\u0000aufirst\";s:1:\"C\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:1:{i:0;s:10:\"BOIZIAU, C\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:6:\"ANCPAC\";s:8:\"\u0000*\u0000genre\";s:10:\"proceeding\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:107:\"Ph\u00e9nom\u00e8nes de surface reli\u00e9s \u00e0 la structure \u00e9lectronique et aux d\u00e9fauts des mat\u00e9riaux technologiques\";s:8:\"\u0000*\u0000place\";s:6:\"Cachan\";s:6:\"\u0000*\u0000pub\";s:9:\"Lavoisier\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
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"O:16:\"EuropePMCOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:10:\"proceeding\";s:6:\"\u0000*\u0000doi\";s:0:\"\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:107:\"Ph\u00e9nom\u00e8nes de surface reli\u00e9s \u00e0 la structure \u00e9lectronique et aux d\u00e9fauts des mat\u00e9riaux technologiques\";s:9:\"\u0000*\u0000jtitle\";s:31:\"Annales de chimie (Paris. 1914)\";s:9:\"\u0000*\u0000stitle\";s:24:\"Ann. chim. (Paris, 1914)\";s:7:\"\u0000*\u0000date\";s:4:\"1986\";s:9:\"\u0000*\u0000volume\";s:2:\"11\";s:8:\"\u0000*\u0000issue\";s:1:\"3\";s:8:\"\u0000*\u0000spage\";s:3:\"179\";s:8:\"\u0000*\u0000epage\";s:3:\"194\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"0151-9107\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:10:\"LE GRESSUS\";s:10:\"\u0000*\u0000aufirst\";s:1:\"C\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:1:{i:0;s:10:\"BOIZIAU, C\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:6:\"ANCPAC\";s:8:\"\u0000*\u0000genre\";s:10:\"proceeding\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:107:\"Ph\u00e9nom\u00e8nes de surface reli\u00e9s \u00e0 la structure \u00e9lectronique et aux d\u00e9fauts des mat\u00e9riaux technologiques\";s:8:\"\u0000*\u0000place\";s:6:\"Cachan\";s:6:\"\u0000*\u0000pub\";s:9:\"Lavoisier\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
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"O:11:\"BaseOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:10:\"proceeding\";s:6:\"\u0000*\u0000doi\";s:0:\"\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:107:\"Ph\u00e9nom\u00e8nes de surface reli\u00e9s \u00e0 la structure \u00e9lectronique et aux d\u00e9fauts des mat\u00e9riaux technologiques\";s:9:\"\u0000*\u0000jtitle\";s:31:\"Annales de chimie (Paris. 1914)\";s:9:\"\u0000*\u0000stitle\";s:24:\"Ann. chim. (Paris, 1914)\";s:7:\"\u0000*\u0000date\";s:4:\"1986\";s:9:\"\u0000*\u0000volume\";s:2:\"11\";s:8:\"\u0000*\u0000issue\";s:1:\"3\";s:8:\"\u0000*\u0000spage\";s:3:\"179\";s:8:\"\u0000*\u0000epage\";s:3:\"194\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"0151-9107\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:10:\"LE GRESSUS\";s:10:\"\u0000*\u0000aufirst\";s:1:\"C\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:1:{i:0;s:10:\"BOIZIAU, C\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:6:\"ANCPAC\";s:8:\"\u0000*\u0000genre\";s:10:\"proceeding\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:107:\"Ph\u00e9nom\u00e8nes de surface reli\u00e9s \u00e0 la structure \u00e9lectronique et aux d\u00e9fauts des mat\u00e9riaux technologiques\";s:8:\"\u0000*\u0000place\";s:6:\"Cachan\";s:6:\"\u0000*\u0000pub\";s:9:\"Lavoisier\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
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"O:12:\"ArXivOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:10:\"proceeding\";s:6:\"\u0000*\u0000doi\";s:0:\"\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:107:\"Ph\u00e9nom\u00e8nes de surface reli\u00e9s \u00e0 la structure \u00e9lectronique et aux d\u00e9fauts des mat\u00e9riaux technologiques\";s:9:\"\u0000*\u0000jtitle\";s:31:\"Annales de chimie (Paris. 1914)\";s:9:\"\u0000*\u0000stitle\";s:24:\"Ann. chim. (Paris, 1914)\";s:7:\"\u0000*\u0000date\";s:4:\"1986\";s:9:\"\u0000*\u0000volume\";s:2:\"11\";s:8:\"\u0000*\u0000issue\";s:1:\"3\";s:8:\"\u0000*\u0000spage\";s:3:\"179\";s:8:\"\u0000*\u0000epage\";s:3:\"194\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"0151-9107\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:10:\"LE GRESSUS\";s:10:\"\u0000*\u0000aufirst\";s:1:\"C\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:1:{i:0;s:10:\"BOIZIAU, C\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:6:\"ANCPAC\";s:8:\"\u0000*\u0000genre\";s:10:\"proceeding\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:107:\"Ph\u00e9nom\u00e8nes de surface reli\u00e9s \u00e0 la structure \u00e9lectronique et aux d\u00e9fauts des mat\u00e9riaux technologiques\";s:8:\"\u0000*\u0000place\";s:6:\"Cachan\";s:6:\"\u0000*\u0000pub\";s:9:\"Lavoisier\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
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