Presented papers/7th. Symposium on applied surface analysis, College Park MD, 15-17 May 1985
- Autor
- GRANT, J. T; MURDAY, J. S
Air Force Office of Scientific Research, United States (Funder/Sponsor)
Office of Naval Research, United States (Funder/Sponsor)
Univ. Dayton, res. inst., Dayton OH 45469, United States - Nombre de la conferencia
- Symposium on applied surface analysis. 7 (College Park 1985-05-15)
- Fuente
Applied surface science. 1986, Vol 25, Num 4, pp 341-486 ; ref : dissem
- Editor
- Elsevier Science, Amsterdam
- País de la publicación
- Netherlands
- Tipo de documento
- Conference Proceedings
- Idioma
- English
- Palabra clave (fr)
- Analyse quantitative Congrès Ion Irradiation Spectre photoélectron Spectrométrie Auger Spectrométrie SIMS Stoechiométrie Surface Traitement surface
- Palabra clave (in)
- Quantitative analysis Congress Ions Irradiation Photoelectron spectrum Auger electron spectrometry Secondary ion mass spectrometry Stoichiometry Surface Surface treatment
- Palabra clave (es)
- Analisis cuantitativo Congreso Ión Irradiacion Espectro fotoelectrones Espectrometría Auger Espectrometría SIMS Estoiquiometria Superficie Tratamiento superficie
- Clasificación
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H90 Other topics in structure, and nonelectronic properties of surfaces and interfaces; thin films and whiskers
- Disciplina
- Physics of condensed state : structure, mechanical and thermal properties
- Procedencia
- Inist-CNRS
- Base de datos
- PASCAL
- Identificador INIST
- 8008041
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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