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Direct observation of the influence of inhomogeneities in InP substrates on the quality of quaternary layers

Author
MARTINS, R. B1 ; RIBEIRO, C. A
[1] Univ. estadual Campinas-UNICAMP, Campinas 13100, Brazil
Source

Materials letters (General ed.). 1986, Vol 4, Num 11-12, pp 458-460 ; ref : 5 ref

CODEN
MLETDJ
ISSN
0167-577X
Scientific domain
Crystallography; Chemical industry parachemical industry; Condensed state physics; Polymers, paint and wood industries
Publisher
Elsevier, Amsterdam
Publication country
Netherlands
Document type
Article
Language
English
Keyword (fr)
Cathodoluminescence Couche mince Couche multiple Croissance cristalline Dislocation Défaut cristallin Epitaxie Hétérogénéité Méthode phase liquide Perfection cristalline Support Support InP
Keyword (en)
Cathodoluminescence Thin film Multiple layer Crystal growth Dislocation Crystal defect Epitaxy Heterogeneity Growth from liquid Crystal perfection Support
Keyword (es)
Catodoluminiscencia Capa delgada Capa múltiple Crecimiento cristalino Dislocación Defecto cristalino Epitaxia Heterogeneidad Método fase líquida Perfección cristalina Sustrato
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A15 Methods of deposition of films and coatings; film growth and epitaxy / 001B80A15L Liquid phase epitaxy; deposition from liquid phases (melts, solutions, and surface layers on liquids)

Discipline
Physics and materials science
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
8234313

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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