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Direct observation of the influence of inhomogeneities in InP substrates on the quality of quaternary layers
- Author
-
MARTINS, R. B1 ; RIBEIRO, C. A
[1]
Univ. estadual Campinas-UNICAMP, Campinas 13100, Brazil
- Source
-
Materials letters (General ed.). 1986, Vol 4, Num 11-12, pp 458-460 ; ref : 5 ref
- CODEN
- MLETDJ
- ISSN
- 0167-577X
- Scientific domain
-
Crystallography; Chemical industry parachemical industry; Condensed state physics; Polymers, paint and wood industries
- Publisher
-
Elsevier, Amsterdam
- Publication country
- Netherlands
- Document type
-
Article
- Language
- English
- Keyword (fr)
-
Cathodoluminescence Couche mince Couche multiple Croissance cristalline Dislocation Défaut cristallin Epitaxie Hétérogénéité Méthode phase liquide Perfection cristalline Support Support InP
- Keyword (en)
-
Cathodoluminescence Thin film Multiple layer Crystal growth Dislocation Crystal defect Epitaxy Heterogeneity Growth from liquid Crystal perfection Support
- Keyword (es)
-
Catodoluminiscencia Capa delgada Capa múltiple Crecimiento cristalino Dislocación Defecto cristalino Epitaxia Heterogeneidad Método fase líquida Perfección cristalina Sustrato
- Classification
-
- Pascal
-
001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A15 Methods of deposition of films and coatings; film growth and epitaxy / 001B80A15L Liquid phase epitaxy; deposition from liquid phases (melts, solutions, and surface layers on liquids)
- Discipline
- Physics and materials science
- Origin
-
Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 8234313
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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