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Direct observation of ballistic electrons in silicon dioxide

Author
DIMARIA, D. J1 ; FISCHETTI, M. V; BATEY, J; DORI, L; TIERNEY, E; STASIAK, J
[1] IBM, Thomas J. Watson res. center, Yorktown Heights NY 10598, United States
Source

Physical review letters. 1986, Vol 57, Num 25, pp 3213-3216 ; ref : 21 ref

CODEN
PRLTAO
ISSN
0031-9007
Scientific domain
Optics; Atomic molecular physics; Condensed state physics; Physics; Plasma physics
Publisher
American Physical Society, Ridge, NY
Publication country
United States
Document type
Article
Language
English
Keyword (fr)
Composé minéral Couche mince Etude expérimentale Interaction électron phonon Phénomène transport Silicium Oxyde Transport ballistique
Keyword (en)
Inorganic compound Thin film Experimental study Electron phonon interaction Transport process Silicon Oxides
Keyword (es)
Compuesto mineral Capa delgada Estudio experimental Interacción electrón fonón Fenómeno transporte Silicio
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70B Electronic transport in condensed matter / 001B70B20 Conductivity phenomena in semiconductors and insulators / 001B70B20F Low-field transport and mobility; piezoresistance

Discipline
Physics of condensed state : electronic structure, electrical, magnetic and optical properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
8251114

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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