Direct observation of ballistic electrons in silicon dioxide
- Author
- DIMARIA, D. J1 ; FISCHETTI, M. V; BATEY, J; DORI, L; TIERNEY, E; STASIAK, J
[1] IBM, Thomas J. Watson res. center, Yorktown Heights NY 10598, United States - Source
Physical review letters. 1986, Vol 57, Num 25, pp 3213-3216 ; ref : 21 ref
- CODEN
- PRLTAO
- ISSN
- 0031-9007
- Scientific domain
- Optics; Atomic molecular physics; Condensed state physics; Physics; Plasma physics
- Publisher
- American Physical Society, Ridge, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Composé minéral Couche mince Etude expérimentale Interaction électron phonon Phénomène transport Silicium Oxyde Transport ballistique
- Keyword (en)
- Inorganic compound Thin film Experimental study Electron phonon interaction Transport process Silicon Oxides
- Keyword (es)
- Compuesto mineral Capa delgada Estudio experimental Interacción electrón fonón Fenómeno transporte Silicio
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70B Electronic transport in condensed matter / 001B70B20 Conductivity phenomena in semiconductors and insulators / 001B70B20F Low-field transport and mobility; piezoresistance
- Discipline
- Physics of condensed state : electronic structure, electrical, magnetic and optical properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 8251114
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1103/PhysRevLett.57.3213 
https://dx.doi.org/10.1103/PhysRevLett.57.3213
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