Thin films of rare earth metal silicides
- Author
- KOLESHKO, V. M1 ; BELITSKY, V. F; KHODIN, A. A
[1] Byelorussian acad. sci., inst. electronics, Minsk 220841, Byelorussia - Source
Thin solid films. 1986, Vol 141, Num 2, pp 277-285 ; ref : 8 ref
- CODEN
- THSFAP
- ISSN
- 0040-6090
- Scientific domain
- Crystallography; Electronics; Metallurgy, welding; Condensed state physics
- Publisher
- Elsevier Science, Lausanne
- Publication country
- Switzerland
- Document type
- Article
- Language
- English
- Keyword (fr)
- Accommodation réseau Composition chimique Composé minéral Conductivité électrique Couche mince Croissance cristalline Diffraction RX Etude expérimentale Interface solide solide Lanthanide Siliciure Morphologie Méthode état solide Recuit thermique Surface
- Keyword (en)
- Mismatch lattice Chemical composition Inorganic compound Electrical conductivity Thin film Crystal growth X ray diffraction Experimental study Solid solid interface Lanthanide Silicides Morphology Growth from solid state Thermal annealing Surface
- Keyword (es)
- Acomodación red Composicion quimica Compuesto mineral Conductividad electrica Capa delgada Crecimiento cristalino Difraccion RX Estudio experimental Interfase sólido sólido Lantánido Morfologia Método estado sólido Recocido térmico Superficie
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 8259597
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/0040-6090(86)90355-X 
https://dx.doi.org/10.1016/0040-6090(86)90355-X
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