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Direct measurements of the complex X-ray atomic scattering factors for elements by X-ray interferometry at the Daresbury synchrotron radiation source

Author
BEGUM, R1 ; HART, M; LEA, K. R; SIDDONS, D. P
[1] King's coll., London WC2R 2LS, United Kingdom
Source

Acta crystallographica. Section A, Foundations of crystallography. 1986, Vol 42, Num 6, pp 456-464 ; ref : 9 ref

CODEN
ACACEQ
ISSN
0108-7673
Scientific domain
Crystallography
Publisher
Blackwell, Oxford
Publication country
United Kingdom
Document type
Article
Language
English
Keyword (fr)
Etude théorique Facteur diffusion atomique Interférométrie RX Méthode mesure Spectrométrie EXAFS Spectrométrie XANES
Keyword (en)
Theoretical study Atomic scattering factor X ray interferometry Measurement method EXAFS spectrometry XANES spectrometry
Keyword (es)
Estudio teórico Factor difusión atómica Interferometría RX Método medida Espectrometría EXAFS Espectrometría XANES
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A10 X-ray diffraction and scattering

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
8263343

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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