Oscillations de plasma dans le champ d'une impureté chargée dans les systèmes d'électrons quasi bidimensionnels
- Author
- MUSIN, D. R1 ; NISHANOV, V. N
[1] AN SSSR, fizicheskij. im. P.N. Lebedeva, Moskva, Ussr - Source
Fizika tverdogo tela. = Solid state physics. 1987, Vol 29, Num 5, pp 1412-1415 ; ref : 9 ref
- CODEN
- FTVTAC
- ISSN
- 0367-3294
- Scientific domain
- Crystallography; Electronics; Condensed state physics
- Publisher
- Nauka, Sankt-Peterburg
- Publication country
- Russian Federation
- Document type
- Article
- Language
- Russian
- Keyword (fr)
- Absorption IR Charge électrique Couche inversion Couche mince Etat localisé Etude théorique Fréquence plasma Impureté Modèle 2 dimensions Plasma solide Profil raie spectrale Résonance plasma
- Keyword (en)
- Infrared absorption Electric charge Inversion layer Thin film Localized state Theoretical study Plasma frequency Impurity Two dimensional model Solid state plasma Spectral line profile Plasma resonance
- Keyword (es)
- Absorción IR Carga electrica Capa inversión Capa delgada Estado localizado Estudio teórico Frecuencia plasma Impureza Modelo 2 dimensiones Plasma sólido Perfil raya espectral Resonancia plasma
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70H Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation / 001B70H66 Optical properties of specific thin films
- Discipline
- Physics of condensed state : electronic structure, electrical, magnetic and optical properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 8361196
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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