Scanning tunneling microscope combined with a scanning electron microscope
- Author
- GERBER, C; BINNIG, G; FUCHS, H; MARTI, O; ROHRER, H
IBM Zurich, res. lab - Source
Review of scientific instruments. 1986, Vol 57, Num 2, pp 221-224 ; ref : 16 ref
- CODEN
- RSINAK
- ISSN
- 0034-6748
- Scientific domain
- Electronics; Physics
- Publisher
- American Institute of Physics, Woodbury, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Amortissement vibration Analyse surface Isolation vibration Microscopie tunnel balayage Microscopie électronique
- Keyword (en)
- Vibration damping Surface analysis Vibration isolation Scanning tunneling microscopy Electron microscopy
- Keyword (es)
- Microscopia electronica
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G78 Electron, positron and ion microscopes, electron diffractometers and related techniques
- Discipline
- Metrology
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 8620803
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1063/1.1138973 
https://dx.doi.org/10.1063/1.1138973
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