Subpicosecond electrooptic sampling: principles and applications
- Author
- VALDMANIS, J. A; MOUROU, G
Univ. Rochester, lab. laser energetics - Source
IEEE journal of quantum electronics. 1986, Vol 22, Num 1, pp 69-78 ; ref : 37 ref
- CODEN
- IEJQA7
- ISSN
- 0018-9197
- Scientific domain
- Electronics; Optics; Telecommunications
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Circuit intégré Circuit rapide Dispositif optoélectronique Dispositif photoélectrique Dispositif électrooptique Echantillonnage Effet Pockels Gallium Arséniure Mesure Photodiode Réponse transitoire Subpicoseconde Transistor effet champ dopage modulé Transistor effet champ
- Keyword (en)
- Integrated circuit Fast circuit Optoelectronic device Photoelectric cell Electrooptical device Sampling Pockels effect Gallium Arsenides Measurement Photodiode Transient response Subpicosecond Modulation doped field effect transistor Field effect transistor
- Keyword (es)
- Muestrario Medida
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03G Electric, optical and optoelectronic circuits / 001D03G02 Circuit properties / 001D03G02C Optical and optoelectronic circuits / 001D03G02C4 Miscellaneous
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 8658530
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/JQE.1986.1072867 
https://dx.doi.org/10.1109/JQE.1986.1072867
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