An XPS investigation of TiO2 thin films on polycrystalline Pt
- Author
- GREENLIEF, C. M; WHITE, J. M; KO, C. S; GORTE, R. J
Univ. Texas, dep. chemistry - Source
Journal of physical chemistry (1952). 1985, Vol 89, Num 23, pp 5025-5028 ; ref : 28 ref
- CODEN
- JPCHAX
- ISSN
- 0022-3654
- Scientific domain
- General chemistry, physical chemistry; Metallurgy, welding; Atomic molecular physics
- Publisher
- American Chemical Society, Washington, DC
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Composé minéral Diffusion chimique Emission photoélectronique Etude expérimentale Métal pur Pt Métal transition Composé Métal transition Métal Rayon X Recuit Réduction chimique Titane Oxyde
- Keyword (en)
- Inorganic compound Chemical diffusion Photoelectron emission Experimental study Transition metal Compounds Transition metal Metal X ray Annealing Chemical reduction Titanium Oxides
- Keyword (es)
- Compuesto mineral Estudio experimental Metal Rayos X
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60F Transport properties of condensed matter (nonelectronic) / 001B60F30 Diffusion in solids / 001B60F30N Chemical interdiffusion; diffusion barriers
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 8825888
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1021/j100269a027 
https://dx.doi.org/10.1021/j100269a027
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