Measurement of surface defects by low-energy electron diffraction
- Author
- HENZLER, M1
[1] Univ., inst. festkörperphysik, Hannover 3000, Germany - Source
Applied physics. A, Solids and surfaces. 1984, Vol 34, Num 4, pp 205-214 ; ref : 36 ref
- CODEN
- APSFDB
- ISSN
- 0721-7250
- Scientific domain
- Electronics; Condensed state physics
- Publisher
- Springer, Berlin
/
Springer, Heidelberg
/
Springer, New York, NY
- Publication country
- Germany
- Document type
- Article
- Language
- English
- Keyword (fr)
- Analyse diagramme diffraction Diffraction électron lent Défaut surface Méthode étude
- Keyword (en)
- Diffraction pattern analysis LEED diffraction Surface defect Investigation method
- Keyword (es)
- Metodo estudio
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A14 Electron diffraction and scattering
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 8912769
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1007/BF00616574 
https://dx.doi.org/10.1007/BF00616574
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