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The generic method of the multistate fault tree analysis

Author
HUANG XIZHI1
[1] Chengdu inst. radio eng., Chengdu, China
Source

Microelectronics and reliability. 1984, Vol 24, Num 4, pp 617-622 ; ref : 4 ref

CODEN
MCRLAS
ISSN
0026-2714
Scientific domain
Electronics
Publisher
Elsevier, Oxford
Publication country
United Kingdom
Document type
Article
Language
English
Keyword (fr)
Arbre défaut Fiabilité système Fiabilité Système complexe
Keyword (en)
Fault tree System reliability Reliability Complex system
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D01 Operational research. Management science / 001D01A Operational research and scientific management / 001D01A06 Reliability theory. Replacement problems

Discipline
Operational research. Management
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
8915069

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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