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The influence of fluids on the microhardness of single crystal silicon

Author
SOO-WOHN LEE1 ; DAE-SOON LIM; DANYLUK, S
[1] Univ. Illinois Chicago, Chicago IL 60680, United States
Source

Journal of materials science letters. 1984, Vol 3, Num 7, pp 651-653 ; ref : 9 ref

CODEN
JMSLD5
ISSN
0261-8028
Scientific domain
Chemical industry parachemical industry; Metallurgy, welding; Condensed state physics; Polymers, paint and wood industries
Publisher
Kluwer Academic Publishers, Dordrecht
Publication country
Netherlands
Document type
Article
Language
English
Keyword (fr)
Dureté Etude expérimentale Microdureté Monocristal Semiconducteur Surface Traitement surface
Keyword (en)
Hardness Experimental study Microhardness Single crystal Semiconductor materials Surface Surface treatment
Keyword (es)
Estudio experimental
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H35 Solid surfaces and solid-solid interfaces / 001B60H35G Mechanical and acoustical properties; adhesion

Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H45 Solid-fluid interfaces

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
8920633

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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