The proton-induced Kossel effect and its application to crystallographic studies
- Author
- GEIST, V1 ; ASCHERON, C
[1] Karl-Marx-univ. Leipzig, sekt. physik, Leipzig 7010, German Democratic Republic - Source
Crystal research and technology (1979). 1984, Vol 19, Num 9, pp 1231-1244 ; ref : 27 ref
- CODEN
- CRTEDF
- ISSN
- 0232-1300
- Scientific domain
- Crystallography; Geology; Metallurgy, welding
- Publisher
- Wiley-VCH, Berlin
- Publication country
- Germany
- Document type
- Article
- Language
- English
- Keyword (fr)
- Composé minéral Diffraction RX Dilatation thermique Distorsion réseau Etude expérimentale Gallium Phosphure Irradiation Méthode Kossel Paramètre cristallin Polarité Proton Résolution structurale Semiconducteur
- Keyword (en)
- Inorganic compound X ray diffraction Thermal expansion Lattice distortion Experimental study Gallium Phosphides Irradiation Kossel method Lattice parameters Polarity Proton Structure resolution Semiconductor materials
- Keyword (es)
- Difraccion RX Estudio experimental Irradiacion
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A10 X-ray diffraction and scattering
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 9010702
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1002/crat.2170190917 
https://dx.doi.org/10.1002/crat.2170190917
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