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The compositional grading of MOCVD-grown GaAs1-xPx via substrate temperature changes

Author
LEWIS, C. R1 ; LUDOWISE, M. J
[1] Varian Associates inc., Palo Alto CA 94303, United States
Source

Journal of electronic materials. 1984, Vol 13, Num 5, pp 749-761 ; ref : 9 ref

CODEN
JECMA5
ISSN
0361-5235
Scientific domain
Crystallography; Electronics; Metallurgy, welding; Condensed state physics
Publisher
Institute of Electrical and Electronics Engineers, New York, NY
Publication country
United States
Document type
Article
Language
English
Keyword (fr)
Composition chimique Composé minéral Composé organométallique Couche mince Croissance cristalline Dépôt chimique phase vapeur Epitaxie Etude expérimentale Gallium Phosphoarséniure Microscopie optique Photoluminescence Solution solide Support Température
Keyword (en)
Chemical composition Inorganic compound Organometallic compound Thin film Crystal growth Chemical vapor deposition Epitaxy Experimental study Gallium Arsenides phosphides Optical microscopy Photoluminescence Solid solution Support Temperature
Keyword (es)
Composicion quimica Estudio experimental Microscopia optica Temperatura
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
9114484

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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