The identification of the initial lamellar thickness of polyethylene crystals grown from the melt using synchrotron X-radiation
- Author
- MARTINEZ-SALAZAR, J1 ; BARHAM, P. J; KELLER, A
[1] Univ. Bristol, H.H. Wills Physics Laboratory, Bristol, United Kingdom - Source
Journal of materials science. 1985, Vol 20, Num 5, pp 1616-1625 ; ref : 15 ref
- Publisher
- Springer, Heidelberg
- Publication country
- Germany
- Document type
- Article
- Language
- English
- Keyword (fr)
- Cristal Cristallisation état fondu Diffractométrie RX Epaisseur Ethylène polymère Polymère linéaire Structure lamellaire
- Keyword (en)
- Crystals Melt crystallization X ray diffractometry Thickness Polyethylene Linear polymer Lamellar structure
- Keyword (es)
- Espesor
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D09 Physicochemistry of polymers / 001D09D Organic polymers / 001D09D04 Properties and characterization / 001D09D04J Crystallization
- Discipline
- Physical chemistry of polymers
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 9145837
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1007/BF00555264 
https://dx.doi.org/10.1007/BF00555264
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