The effect of trapped electrons on the beam-induced current. II
- Author
- TAGUCHI, M1
[1] Univ. Tokyo, fac. eng., dep. applied physics, Bunkyo-ku Tokyo 113, Japan - Source
Journal of the Physical Society of Japan. = Nihon Butsuri Gakkai ōji hōkoku. 1984, Vol 53, Num 9, pp 3004-3009 ; ref : 15 ref
- CODEN
- JUPSAU
- ISSN
- 0031-9015
- Scientific domain
- Crystallography; Mechanics acoustics; Condensed state physics; Theoretical physics
- Publisher
- Institute of Pure and Applied Physics, Tokyo
/
Physical Society of Japan, Tokyo
- Publication country
- Japan
- Document type
- Article
- Language
- English
- Keyword (fr)
- Configuration toroïdale Courant électrique Electron piégé Faisceau ionique Génération
- Keyword (en)
- Toroidal configuration Electric current Trapped electron Ion beam Generation
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B50 Physics of gases, plasmas and electric discharges / 001B50B Physics of plasmas and electric discharges / 001B50B50 Plasma production and heating
- Discipline
- Physics of gases, plasmas and electric discharges
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 9156733
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1143/JPSJ.53.3004 
https://dx.doi.org/10.1143/JPSJ.53.3004
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