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Direct imaging of transient molecular structures with ultrafast diffraction

Author
IHEE, Hyotcherl1 ; LOBASTOV, Vladimir A1 ; GOMEZ, Udo M1 ; GOODSON, Boyd M1 ; SRINIVASAN, Ramesh1 ; RUAN, Chong-Yu1 ; ZEWAIL, Ahmed H1
[1] Laboratory for Molecular Sciences, Arthur Amos Noyes Laboratory of Chemical Physics, California Institute of Technology, Pasadena, CA 91125, United States
Source

Science (Washington, D.C.). 2001, Vol 291, Num 5503, pp 458-462

CODEN
SCIEAS
ISSN
0036-8075
Scientific domain
Multidisciplinary
Publisher
American Association for the Advancement of Science, Washington, DC
Publication country
United States
Document type
Article
Language
English
Keyword (fr)
Angle liaison Appareillage Diffraction électron Diffractomètre Domaine temps fs Décyclisation Fluor composé Imagerie Intermédiaire réaction Iode composé Longueur liaison Radical libre Structure moléculaire Cyclohexa-1,3-diène Diffraction électron ultrarapide Ethane(diiodo tétrafluoro) Ethylène(tétrafluoro) Hexa-1,3,5-triène
Keyword (en)
Bond angle Instrumentation Electron diffraction Diffractometer fs range Ring cleavage Fluorine compound Imagery Reaction intermediate Iodine compounds Bond length Free radical Molecular structure Ultrafast electron diffraction
Keyword (es)
Angulo enlace Instrumentación Difracción electrónica Difractómetro Desciclización Flúor compuesto Imaginería Intermediario reacción Iodo compuesto Longitud enlace Radical libre Estructura molecular
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G78 Electron, positron and ion microscopes, electron diffractometers and related techniques

Pascal
001 Exact sciences and technology / 001C Chemistry / 001C01 General and physical chemistry / 001C01A Theory of reactions, general kinetics. Catalysis. Nomenclature, chemical documentation, computer chemistry / 001C01A02 Theory of reactions, general kinetics

Pacs
0778 Electron, positron, and ion microscopes, electron diffractometers, and related techniques

Discipline
General chemistry and physical chemistry Metrology
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
916599

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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