The direct indexing of two-beam electron diffraction patterns
- Other title
- L'indexation directe de diagrammes de diffraction d'électrons à deux faisceaux (fr)
- Author
- TAMBUYSER, P
Joint res. cent - Source
Metallography. 1985, Vol 18, Num 1, pp 41-49 ; ref : 4 ref
- CODEN
- MEIJAP
- ISSN
- 0026-0800
- Scientific domain
- Metallurgy, welding; Condensed state physics
- Publisher
- Elsevier, New York, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Alliage Diffraction électron Dislocation Microscope électronique Méthode étude Vecteur Burgers
- Keyword (en)
- Alloys Electron diffraction Dislocation Electron microscope Examination method Investigation method Burgers vector
- Keyword (es)
- Metodo estudio
- Keyword (de)
- Legierung Elektronenbeugung Versetzung Elektronenmikroskop Untersuchungsmethode
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A72 Defects and impurities in crystals; microstructure / 001B60A72F Direct observation of dislocations and other defects (etch pits, decoration, electron microscopy, x-ray topography, etc.)
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 9207004
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/0026-0800(85)90032-1 
https://dx.doi.org/10.1016/0026-0800(85)90032-1
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