The microstructure of RuO2 thick film resistors and the influence of glass particle size on their electrical properties
- Author
- INOKUMA, T; TAKETA, Y; HARADOME, M
Shoei Chemical inc - Source
IEEE transactions on components, hybrids, and manufacturing technology. 1984, Vol 7, Num 2, pp 166-175 ; ref : 17 ref
- CODEN
- ITTEDR
- ISSN
- 0148-6411
- Scientific domain
- Electronics
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Conductivité électrique Frittage Grosseur grain Microstructure Poudre Ruthénium Oxyde Résistance couche épaisse Résistance électrique Verre
- Keyword (en)
- Electrical conductivity Sintering Grain size Microstructure Powder Ruthenium Oxides Thick film resistor Resistor Glass
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03D Electronic equipment and fabrication. Passive components, printed wiring boards, connectics
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 9657954
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/TCHMT.1984.1136345 
https://dx.doi.org/10.1109/TCHMT.1984.1136345
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