Atomic Force Microscope techniques for adhesion measurements
- Author
- SCHAEFER, D. M1 ; GOMEZ, J2
[1] Department of Physics, Astronomy and Geosciences, Towson University, Towson MD 21252, United States
[2] Dept. Fisica de la Materia Condensada, Universidad Autonoma de Madrid, 28049-Madrid, Spain - Source
The Journal of adhesion (Print). 2000, Vol 74, Num 1-4, pp 341-359 ; ref : 32 ref
- CODEN
- JADNAJ
- ISSN
- 0021-8464
- Scientific domain
- Metallurgy, welding; Polymers, paint and wood industries
- Publisher
- Taylor and Francis, Basingstoke
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Keyword (fr)
- Adhérence Analyse quantitative Effet mémoire Mesure force Microscopie force atomique Méthode mesure Temps réel
- Keyword (en)
- Adhesion Quantitative analysis Memory effect Force measurement Atomic force microscopy Measurement method Real time
- Keyword (es)
- Adherencia Análisis cuantitativo Efecto memoria Medición esfuerzo Microscopía fuerza atómica Método medida Tiempo real
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40F Solid mechanics / 001B40F30 Structural and continuum mechanics / 001B40F30R Measurement and testing methods
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H35 Solid surfaces and solid-solid interfaces / 001B60H35G Mechanical and acoustical properties; adhesion
- Discipline
- Physics : solid mechanics Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 969131
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1080/00218460008034535 
https://dx.doi.org/10.1080/00218460008034535
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