AUTOMATIC PLOTTING OF LANGMUIR-PROBE SUSCEPTANCE- AND CONDUCTANCE-VOLTAGE CURVES
- Author
- OLSON RA; NORDLUND DR
SYSTEMS RESEARCH LABORATORIES INC., DAYTON, OHIO - Source
- J. APPL. PHYS.; U.S.A.; DA. 1972; VOL. 43; NO 6; PP. 2780-2785; BIBL. 10 REF.
- Document type
- Serial Issue
- Language
- English
- Keyword (fr)
- ADMITTANCE ELECTRIQUE CARACTERISTIQUE ADMITTANCE TENSION SONDE SONDE ELECTROSTATIQUE SONDE PLANE SONDE SPHERIQUE PLASMA SANS COLLISION PLASMA COLLISIONNEL ARGON MERCURE VAPEUR MERCURE ELECTROMAGNETISME ELECTRONIQUE
- Keyword (en)
- ELECTROMAGNETISM ELECTRONICS
- Keyword (es)
- ELECTROMAGNETISMO ELECTRONICA
- Classification
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL7314501365
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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