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DUAL MAGNETIC PROBE SYSTEM FOR PHASE MEASUREMENTS IN THERMAL INDUCTION PLASMAS

Author
ECKERT HU
THE AEROSPACE CORP., EL SEGUNDO, CALIF.
Source
J. APPL. PHYS.; U.S.A.; DA. 1972; VOL. 43; NO 6; PP. 2707-2713; BIBL. 10 REF.
Document type
Serial Issue
Language
English
Keyword (fr)
SONDE MAGNETIQUE SONDE DOUBLE SONDE REFROIDIE CONDUCTIVITE ELECTRIQUE BOBINE EXPLORATRICE CHAMP MAGNETIQUE CHAMP HAUTE FREQUENCE DISTRIBUTION CHAMP DIAGNOSTIC PLASMA ARGON MESURE ELECTROMAGNETISME ELECTRONIQUE
Keyword (en)
ELECTROMAGNETISM ELECTRONICS
Keyword (es)
ELECTROMAGNETISMO ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7314501368

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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