COMPARISON OF SECONDARY ION YIELDS FROM CONDUCTING, SEMICONDUCTING AND NONCONDUCTING TARGETS BOMBARDED WITH 40 KEV ARGON IONS
- Author
- JURELA Z
- Source
- RAD. EFFECTS; G.B.; DA. 1972; VOL. 13; NO 3; PP. 167-170; BIBL. 5 REF.
- Document type
- Serial Issue
- Language
- English
- Keyword (fr)
- EMISSION IONIQUE SECONDAIRE DIELECTRIQUE MATERIAU SEMICONDUCTEUR BOMBARDEMENT IONIQUE MATERIAU CONDUCTEUR ELECTROMAGNETISME ELECTRONIQUE
- Keyword (en)
- ELECTROMAGNETISM ELECTRONICS
- Keyword (es)
- ELECTROMAGNETISMO ELECTRONICA
- Classification
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL7314502693
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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