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ELECTRIC-FIELD-INDUCED INTERFERENCE EFFECTS AT THE GROUND EXCITATION LEVEL IN GAAS

Author
EVANGELISTI F; FROVA A; FISCHBACH JU
PHYS. INST., UNIV. STUTTGART, STUTTGART, GER.
Source
PHYS. REV. LETTERS; U.S.A.; DA. 1972; VOL. 29; NO 15; PP. 1001-1004; BIBL. 13 REF.
Document type
Serial Issue
Language
English
Keyword (fr)
EXCITON ARSENIURE GALLIUM ETAT FONDAMENTAL INTERFERENCE REFLEXION ELECTROOPTIQUE EFFET CHAMP ELECTRIQUE CHAMP ELECTRIQUE MATERIAU SEMICONDUCTEUR COUCHE APPAUVRISSEMENT BARRIERE SCHOTTKY INTERFACE METAL SEMICONDUCTEUR INTERFACE OR ARSENIURE GALLIUM ELECTROMAGNETISME ELECTRONIQUE
Keyword (en)
ELECTROMAGNETISM ELECTRONICS
Keyword (es)
ELECTROMAGNETISMO ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7314502762

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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