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COMPARISON OF MICROWAVE-INDUCED CONSTANT-VOLTAGE STEPS IN PB AND SN JOSEPHSON JUNCTIONS

Author
DAN BRACKEN T; HAMILTON WO
STANFORD UNIV., STANFORD, CALIF.
Source
PHYS. REV., B; U.S.A.; DA. 1972; VOL. 6; NO 7; PP. 2603-2609; BIBL. 7 REF.
Document type
Serial Issue
Language
English
Keyword (fr)
TENSION ELECTRIQUE SIGNAL ESCALIER JONCTION JOSEPHSON DISPOSITIF SUPRACONDUCTEUR INTERFERENCE QUANTIQUE TENSION INDUITE HYPERFREQUENCE IRRADIATION INTERFACE PLOMB OXYDE PLOMB INTERFACE ETAIN OXYDE ETAIN ELECTROMAGNETISME ELECTRONIQUE
Keyword (en)
ELECTROMAGNETISM ELECTRONICS
Keyword (es)
ELECTROMAGNETISMO ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7314502838

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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