Pascal and Francis Bibliographic Databases

Help

Permanent link : http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=PASCAL7314505350

Export

Selection :

DETERMINATION OF THE RELATIVE NITROGEN DOPING LEVEL OF TANTALUM NITRIDE RESISTOR FILM BY MEANS OF THE SEEBECK EFFECT

Author
TRUDEL ML
BELL TELEPHONE LAB. INC., ALLENTOWN, PA
Source
I.E.E.E. TRANS. PARTS HYBR. PACKAG.; U.S.A.; DA. 1972; VOL. 8; NO 3; PP. 16-21; BIBL. 4 REF.
Document type
Serial Issue
Language
English
Keyword (fr)
DEPOT PULVERISATION CATHODIQUE PULVERISATION REACTIVE RESISTANCE ELECTRIQUE RESISTANCE COUCHE MINCE NITRURE TANTALE CIRCUIT INTEGRE COUCHE MINCE AZOTE DOPAGE AZOTE NIVEAU DOPAGE EFFET SEEBECK COUCHE MINCE PREPARATION COUCHE MINCE APPAREILLAGE ESSAI CONTROLE MATERIAU CARACTERISTIQUE APPLICATION ELECTROMAGNETISME ELECTRONIQUE
Keyword (en)
ELECTROMAGNETISM ELECTRONICS
Keyword (es)
ELECTROMAGNETISMO ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7314505350

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

Searching the Web