Pascal and Francis Bibliographic Databases

Help

Export

Selection :

Permanent link
http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=PASCAL7314506418

CONTACT RESISTANCES OF AU-GE-NI, AU-ZN AND AL TO III-V COMPOUNDS

Author
SHIH KK; BLUM JM
I.B.M. THOMAS J. WATSON RES. CENT., YORKTOWN HEIGHTS, N.Y., U.S.A.
Source
SOLID-STATE ELECTRON.; G.B.; DA. 1972; VOL. 15; NO 11; PP. 1177-1180; BIBL. 12 REF.
Document type
Serial Issue
Language
English
Keyword (fr)
CONTACT ELECTRIQUE RESISTANCE CONTACT ALLIAGE ALUMINIUM GERMANIUM NICKEL ALLIAGE OR ZINC MATERIAU SEMICONDUCTEUR COMPOSE BINAIRE ELEMENT GROUPE III ELEMENT GROUPE V CONTACT OHMIQUE ELECTROMAGNETISME ELECTRONIQUE
Keyword (en)
ELECTROMAGNETISM ELECTRONICS
Keyword (es)
ELECTROMAGNETISMO ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7314506418

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

Searching the Web