A NEW DIRECT METHOD FOR CHARACTERIZING STRUCTURES WITH STACKING FAULTS, BUILT UP FROM TRANSLATIONALLY EQUIVALENT LAYERS. I. FAULTS IN STACKINGS OF THREE AND FOUR LAYERS
- Author
- FARKAS JAHNKE M
RES. INST. TECH. PHYS., HUNG. ACAD. SCI., BUDAPEST, HUNG. - Source
- ACTA CRYSTALLOGR., B; DANEM.; DA. 1973; VOL. 29; NO 5; PP. 407-413; H.T. 2; BIBL. 34 REF.
- Document type
- Serial Issue
- Language
- English
- Keyword (fr)
- DIFFRACTION RAYON X DIFFRACTOMETRIE RAYON X POLYTYPISME DEFAUT EMPILEMENT DIAGRAMME OSCILLATION TECHNIQUE ETUDE CRISTALLOGRAPHIE
- Keyword (en)
- CRISTALLOGRAPHY
- Keyword (es)
- CRISTALOGRAFIA
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL7316105138
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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