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A NEW DIRECT METHOD FOR CHARACTERIZING STRUCTURES WITH STACKING FAULTS, BUILT UP FROM TRANSLATIONALLY EQUIVALENT LAYERS. II. FAULTS IN FIVE-LAYER STRUCTURE ELEMENTS

Author
FARKAS JAHNKE M
RES. INST. TECH. PHYS., HUNG. ACAD. SCI., BUDAPEST, HUNG.
Source
ACTA CRYSTALLOGR., B; DANEM.; DA. 1973; VOL. 29; NO 3; PP. 413-420; BIBL. 4 REF.
Document type
Serial Issue
Language
English
Keyword (fr)
DIFFRACTION RAYON X DIFFRACTOMETRIE RAYON X POLYTYPISME DEFAUT EMPILEMENT TECHNIQUE ETUDE CRISTALLOGRAPHIE
Keyword (en)
CRISTALLOGRAPHY
Keyword (es)
CRISTALOGRAFIA
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7316105139

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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