ROENTGENTOPOGRAPHISCHE HOCHTEMPERATURUNTERSUCHUNGEN AN SILIZIUM
- Other title
- ETUDES AUX HAUTES T SUR LE SI PAR TOPOGRAPHIE AUX RX (fr)
- Author
- GRIENAUER H; ECKERS W
MUENCHEN, SIEMENS A.G. - Source
- SIEMENS FORSCH.-U. ENTWICKL.-BER.; DTSCH.; DA. 1972; VOL. 1; NO 3; PP. 292-296; ABS. ANGL.; BIBL. 9 REF.
- Document type
- Serial Issue
- Language
- German
- Keyword (fr)
- SILICIUM DEFAUT CRISTALLIN DEFORMATION DEFORMATION PLASTIQUE RECUIT GLISSEMENT MONOCRISTAL TOPOGRAPHIE RAYON X APPAREILLAGE CHAMBRE DIFFRACTION HAUTE TEMPERATURE OBSERVATION CRISTALLOGRAPHIE
- Keyword (en)
- CRISTALLOGRAPHY
- Keyword (es)
- CRISTALOGRAFIA
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL7316106745
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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