DETERMINATION OF TRACE ELEMENTS IN SILICATE MATRICES BY DIFFERENTIAL CATHODE RAY POLAROGRAPHY
- Author
- MAIENTHAL EJ
NATL. BUR. STAND., WASHINGTON, D.C. - Source
- ANAL. CHEM.; U.S.A.; DA. 1973; VOL. 45; NO 4; PP. 644-648; BIBL. 10 REF.
- Document type
- Serial Issue
- Language
- English
- Keyword (fr)
- OSCILLOPOLAROGRAPHIE ANALYSE CHIMIQUE VERRE ELEMENT TRACE ANALYSE DE CHIMIE ANALYTIQUE INDUSTRIE CHIMIQUE
- Keyword (en)
- ANALYTICAL CHEMISTRY CHEMICAL INDUSTRY
- Keyword (es)
- QUIMICA ANALYTICA INDUSTRIA QUIMICA
- Classification
- Discipline
- Chemical engineering General chemistry and physical chemistry
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL7317032391
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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