INTERPRETATION OF SECONDARY ION MASS SPECTRA BY MEANS OF FINGERPRINT SPECTRA AND SECONDARY ION IMAGING
- Author
- WERNER HW; MORGAN AE; DE GREFTE HAM
PHILIPS RES. LAB., EINDHOVEN, NETH. - Source
- APPL. PHYS.; GERM.; DA. 1975; VOL. 7; NO 1; PP. 65-69; BIBL. 15 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- SPECTROMETRIE MASSE SPECTROMETRIE MASSE IONISATION SECONDAIRE ANALYSE CHIMIQUE ANALYSE SURFACE TRAITEMENT DONNEE UTILISATION ELECTRODE NICKEL COUCHE MINCE NICKEL OXYDE CHIMIE ANALYTIQUE
- Keyword (en)
- ANALYTICAL CHEMISTRY
- Keyword (es)
- QUIMICA ANALYTICA
- Classification
- Discipline
- General chemistry and physical chemistry
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL7517034695
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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