MEASUREMENTS OF PHOTOELECTRON LIFETIMES IN SILVER HALIDE MICROCRYSTALS USING MICROWAVE TECHNIQUES.
- Author
- KELLOGG LM
EASTMAN CO., ROCHESTER, N.Y. 14650 - Source
- PHOTOGR. SCI. ENGNG; U.S.A.; DA. 1974; VOL. 18; NO 4; PP. 378-382; BIBL. 12 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- DUREE VIE PHOTOELECTRON COMPOSE ARGENT HALOGENURE HYPERFREQUENCE EMULSION PHOTOGRAPHIQUE MATERIAU PHOTOGRAPHIQUE MESURE HALOGENURE ARGENT METROLOGIE PHYSIQUE THEORIQUE
- Keyword (en)
- MEASUREMENT SCIENCE THEORETICAL PHYSICS
- Keyword (es)
- METROLOGIA FISICA TEORICA
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics
- Discipline
- Theoretical physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL7530016826
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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