MEASURING THE REFRACTIVE INDEX AND THICKNESS OF THIN TRANSPARENT FILMS: METHOD.
- Author
- DANEU V; SANCHEZ A
INST. ELETTROTEC., PALERMO, ITALY - Source
- APPL. OPT.; U.S.A.; DA. 1974; VOL. 13; NO 1; PP. 122-128; BIBL. 8 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- REFRACTOMETRIE INDICE REFRACTION COUCHE MINCE EPAISSEUR COUCHE MINCE TRANSPARENTE INTERFERENCE OPTIQUE MESURE OPTIQUE
- Keyword (en)
- OPTICS
- Keyword (es)
- OPTICA
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics
- Discipline
- Theoretical physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL7530017509
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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