Pascal and Francis Bibliographic Databases

Help

Permanent link : http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=PASCAL7530025821

Export

Selection :

DETERMINATION OF THE ELECTRIC FIELD ENHANCEMENT FACTOR AND CRATER DIMENSIONS IN ALUMINUM FROM SCANNING ELECTRON MICROGRAPHS.

Other title
DETERMINATION DU FACTEUR D'AUGMENTATION DU CHAMP ELECTRIQUE ET DES DIMENSIONS DES CRATERES DANS AL A PARTIR DE MICROGRAPHIES ELECTRONIQUES A BALAYAGE (fr)
Author
HACKAM R
ELECTRON. ELECTR. ENG. DEP., UNIV. SHEFFIELD, SHEFFIELD, S1 3JD, ENGL.
Source
J. APPL. PHYS.; U.S.A.; DA. 1974; VOL. 45; NO 1; PP. 114-118; BIBL. 41 REF.
Document type
Article
Language
English
Keyword (fr)
MICROSCOPIE ELECTRONIQUE MICROSCOPE BALAYAGE ANODE CATHODE ALUMINIUM HAUTE TENSION DECHARGE ELECTRIQUE VIDE ELECTROMAGNETISME ELECTRONIQUE
Keyword (en)
ELECTROMAGNETISM ELECTRONICS
Keyword (es)
ELECTROMAGNETISMO ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7530025821

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

Searching the Web